Homepage Stefan Krey - Publications

Peer reviewed papers

High-T _c SQUID magnetometers for biomagnetic measurements,: B. David, D. Grundler, S. Krey, V. Doormann, R. Eckart, J.P. Krumme, G.Rabe, and O. Dössel, Supercond. Sci. Technol. 9, A96-A99 (1996). [PDF].
Low noise YBa₂Cu₃O_7-x SQUID magnetometers operated with additional positive feedback,: D. Drung, E. Dantsker, F. Ludwig, H. Koch, R. Kleiner, J. Clarke, S. Krey, D. Reimer, B. David and O. Dössel, Appl. Phys. Lett. 68, 1856 (1996). [PDF].
Biomagnetic measurements with an integrated YBa₂Cu₃O₇ magnetometer in a hand-held cryostat,: M. Schilling, S. Krey, and R. Scharnweber, Appl. Phys. Lett. 69, 2749 (1996). [PDF].
Integrated YBa₂Cu₃O₇ Magnetometers for Biomagnetic Applications,: S. Krey, K.-O. Subke, D. Reimer, M. Schilling, R. Scharnweber, and B. David, Applied Superconductivity Vol. 5, Nos 7-12, pp. 213-219 (1998). [PDF].
Low noise operation of integrated YBa₂Cu₃O₇ magnetometers in static magnetic fields,: S. Krey, B. David, R. Eckart, and O. Dössel, Appl. Phys. Lett. 72, 3205 (1998). [PDF].
Technology for YBa₂Cu₃O₇ SNS- and SIS-Josephson Junctions,: K.-O. Subke, S. Krey, H. Burkhardt, A. Bartold, and M. Schilling, IEEE Trans. Appl. Supercond. 9, 3125 (1999). [PDF].
Noise Properties of YBa₂Cu₃O₇ Josephson Junction Array Magnetometers,: S. Krey, O. Brügmann, H. Burkhardt, and M. Schilling, IEEE Trans. Appl. Supercond. 9, 3401 (1999). [PDF].
Highly sensitive magnetometers based on YBa₂Cu₃O₇ Josephson junction arrays,: S. Krey, O. Brügmann, and M. Schilling, Appl. Phys. Lett. 74, 293 (1999). [PDF].
Low-frequency noise and linearity of YBa₂Cu₃O₇ dc superconducting quantum interference device magnetometers in static magnetic fields,: S. Krey, H.-J. Barthelmess, and M. Schilling, J. Appl. Phys. 86, 6602 (1999). [PDF].
Sensitive Josephson magnetometry of flux quantization in a normal conducting hole in a narrow YBa₂Cu₃O₇ line,: H.-J. Barthelmess, S. Krey, S. Ostertun, and M. Schilling, Appl. Phys. Lett. 77, 1882 (2000). [PDF].

Conference proceedings

High-T _c SQUID Magnetometers for Magnetocardiography,: O. Dössel, B. David, R. Eckart, D. Grundler, S. Krey, Proceedings of 2^nd Workshop on HTS Applications and New Materials, University of Twente, Enschede, The Netherlands, May 8-10, 1995, Ed. Dave H.A. Blank. [PDF].
Ein Mehrschleifen-SQUID Magnetometer basierend auf YBaCuO-Stufenkontakten,: S. Krey, B. David, V. Doormann, R. Eckart, J.P. Krumme, G. Rabe und O. Dössel, Konferenz Kryoelektronische Bauelemente '95 (Kryo '95), Weilrod-Mauloff, 8.-10. Oktober 1995. [Kurzfassung].
SQUID Magnetometers made from NdBa₂Cu₃0₇ and YBa₂Cu₃0₇ thin-films: B. David, S. Krey, R. Eckart, V. Doormann, G. Rabe, J. P. Krumme, and O. Dössel, Proceedings of the 1996 Applied Superconductivity Conference (ASC´96), August 25-30, 1996, Pittsburgh, Pennsylvania. [Poster].
Optimierung von Mehrschleifen-SQUID-Magnetometern für den Betrieb in unabgeschirmter Umgebung,: S. Krey, B. David, V. Doormann, R. Eckart, J.P. Krumme, G. Rabe und O. Dössel, Konferenz Kryoelektronische Bauelemente '96 (Kryo '96), Jena, 6.-8. Oktober 1996. [Kurzfassung].
Biomagnetische Anwendungen mit integrierten Hoch-T_c Magnetometern bei 77 K,: M. Schilling, S. Krey, D. Reimer, R. Scharnweber, K.-O. Subke und U. Merkt, Konferenz Kryoelektronische Bauelemente '96 (Kryo '96), Jena, 6.-8. Oktober 1996. [Kurzfassung].
Process Optimization for High Yield of YBa₂Cu₃O₇ Ramp-Edge Josephson Junctions with PrBa ₂Cu₃O₇ Barriers,: K.-O. Subke, S. Krey, H. Burkhardt, D. Reimer, and M. Schilling, Proceedings of the 6^th International Superconductive Electronics Conference (ISEC´97), June 25-28, 1997, Berlin, Germany, Eds. H. Koch and S. Knappe. [Extended Abstract].
Integrated YBa₂Cu₃O₇ Magnetometers for Biomagnetic Applications,: S. Krey, K.-O. Subke, D. Reimer, M. Schilling, and R. Scharnweber, Proceedings of the 6^th International Superconductive Electronics Conference (ISEC´97), June 25-28, 1997, Berlin, Germany, Eds. H. Koch and S. Knappe, [Extended Abstract].
Optimierung von Josephson-Kontakten in Rampengeometrie auf hohe Reproduzierbarkeit für den Einsatz in rauscharmen integrierten Magnetometern,: K.-O. Subke, S. Krey, H. Burkhardt, M. Schilling, Konferenz Kryoelektronische Bauelemente '97 (Kryo '97), Bad Herrenalb, 21.-23. September 1997. [Kurzfassung].
Noise Properties of YBa₂Cu₃O₇ Josephson Junction Array Magnetometers,: S. Krey, O. Brügmann, H. Burkhardt, and M. Schilling, Proceedings of the 1998 Applied Superconductivity Conference (ASC´98), September 13-18, 1998, Palm Desert, California, [Extended Abstract].
Low-frequency noise and linearity of YBa₂Cu₃O₇ dc SQUID magnetometers in static magnetic fields,: S. Krey, H.-J. Barthelmess, and M. Schilling, Proceedings of the 7^th International Superconductive Electronics Conference (ISEC´99), June 21-25, 1999, Berkeley, CA, [Extended Abstract], [Poster].
Operation of integrated HTS dc-SQUID magnetometers in unshielded environment,: K.-O. Subke, C. Hinnrichs, S. Krey, H.-J. Barthelmess, C. Pels and M. Schilling, Proc. EUCAS '99, 4^th European Conference on Applied Superconductivity, Sept. 14-17, 1999, Sitges, Spain, [PDF].
Novel concept for the ultraprecise and fast measurement of the nanotopography of large wafers,: I. Weingärtner, M. Wurm, R.D. Geckeler, C. Elster, M. Schulz, E. Dumitrescu, S. Krey, J. Heinisch, Proc. SPIE Vol. 4779, p. 13-22, Nov. 2002, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components; Angela Duparré, Bhanwar Singh; Eds. [PDF].
Ultra-Fast MTF Test for High-Volume Production of CMOS Imaging Cameras,: M. Dahl, J. Heinisch, S. Krey, S. Bäumer, J. Lurquin, Linghua Chen, Proceedings of the SPIE International Symposium on Optical Science and Technology, Aug. 3-8, 2003, San Diego. [PDF].
Wafer Topography Measurement by Fast Optical Scanning Deflectometry,: S. Krey, F. Peter, E. Dumitrescu, W.D. van Amstel, R.G. Klaver, E.J. Lous, Proceedings of the CLEO/EUROPE 2003 Conference on Lasers and Electro-Optics/Europe, June 22-27, 2003, Munich. [Abstract].
Accurate Topography Measurement of Large Flat Surfaces,: F. Peter, S. Krey, E. Dumitrescu, I. Weingärtner, M. Wurm, H. Winkler, Proceedings of the CLEO/EUROPE 2003 Conference on Lasers and Electro-Optics/Europe, June 22-27, 2003, Munich. [Abstract].
A fast optical scanning deflectometer for measuring the topography of large silicon wafers,: S. Krey, W. D. van Amstel, K. Szwedowicz, J. Campos, A. Moreno, E. J. Lous, Proc. SPIE Vol. 5523, p. 110-120, Oct. 2004, Current Developments in Lens Design and Optical Engineering V; Pantazis Z. Mouroulis, Warren J. Smith, R. Barry Johnson; Eds. [PDF].
Measurement of Aspheric Surfaces with 3D-Deflectometry,: I. Scheele, S. Krey, Proceedings of the 106^th Conference of the DGaO, May 17-21, 2005, Wrocław, [Extended Abstract].
Integrated Optical Characterization of Intraocular Lenses,: S. Krey, J. Heinisch, Laser Optics Berlin (LOB), March 23-24, 2006, Berlin, [Abstract], [Poster].
Novel technique for measurement of centration errors of complex completely mounted multi-element objective lenses,: J. Heinisch, E. Dumitrescu, and S. Krey Proc. SPIE 6288, 628810 (2006), DOI:10.1117/12.693356, Aug. 14, 2006, San Diego, Current Developments in Lens Design and Optical Engineering VII, Pantazis Z. Mouroulis; Warren J. Smith; R. Barry Johnson, Eds. [PDF].
Automatic Centring and Bonding of Lenses,: S. Krey, J. Heinisch, E. Dumitrescu, Proceedings of SPIE Optifab 2007, May 14-17, 2007, Rochester. [Extended Abstract].
Aspheric lens tester with Shack-Hartmann sensor,: A. K. Ruprecht, I. Scheele, S. Krey, J. Heinisch, Proceedings of SPIE Optifab 2007, May 14-17, 2007, Rochester. [Extended Abstract].
Measurement of aspheric surfaces with 3D-Deflectometry,: I. Scheele, S. Krey, J. Heinisch, Proceedings of SPIE Optifab 2007, May 14-17, 2007, Rochester. [Extended Abstract].
Highest Precision Centering Error Measurement,: J. Heinisch, E. Dumitrescu, S. Krey, Proceedings of SPIE Optifab 2007, May 14-17, 2007, Rochester. [Extended Abstract].
Realtime MTF measurement of CMOS and CCD cameras,: J. Heinisch, E. Dumitrescu, S. Krey, Proceedings of SPIE Optifab 2007, May 14-17, 2007, Rochester. [Extended Abstract].
High quantity wavefront measurement of miniature aspheric optics on wafer level,: I. Erichsen, M. Cherrier, A. Ruprecht, S. Krey, Proceedings of the Conference on Lasers and Electro Optics (CLEO) 2008, May 4-9, 2008, San Jose , [Extended Abstract].
Ultra-fast wavefront analyser for high volume production of camera modules lenses,: M. Cherrier, I. Erichsen, A. Ruprecht, and S. Krey, Proc. SPIE 6995, 699512 (2008), DOI:10.1117/12.781433, Apr. 8, 2008, Strasbourg, Optical Micro- and Nanometrology in Microsystems Technology II, Christophe Gorecki, Anand K. Asundi, Wolfgang Osten, Eds., [PDF].
High resolution wavefront measurement of aspheric optics,: I. Erichsen, S. Krey, J. Heinisch, A. Ruprecht, and E. Dumitrescu, Proc. SPIE 7060, 70600T (2008), DOI:10.1117/12.794467, Aug. 11, 2008, San Diego, Current Developments in Lens Design and Optical Engineering IX, Pantazis Z. Mouroulis, Warren J. Smith, R. Barry Johnson, Eds. [PDF].
Quality Assurance of Modern Optics in Production,: S. Krey, Kolloquium »Optik – Schlüsseltechnologie mit Zukunft«, Fraunhofer-Institut für Produktionstechnologie (IPT), 18.-19. März 2009, Aachen. [Extended Abstract], [Presentation].

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